Characterization of diffraction patterns directly from in-line holograms with the fractional Fourier transform

被引：35

作者：

Coëtmellec, S ^{[1
]}

Lebrun, D ^{[1
]}

Özkul, C ^{[1
]}

机构：

[1] Unite Mixte Rech Technopole Madrillet, F-76801 St Etienne Du Rouvray, France

来源：

APPLIED OPTICS | 2002年 / 41卷 / 02期

关键词：

D O I：

10.1364/AO.41.000312

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We show that the fractional Fourier transform is a suitable mechanism with which to analyze the diffraction patterns produced by a one-dimensional object because its intensity distribution is partially described by a linear chirp function. The three-dimensional location and the diameter of a fiber can be determined, provided that the optimal fractional order is selected. The effect of compaction of the intensity distribution in the fractional Fourier domain is discussed. A few experimental results are presented. (C) 2002 Optical Society of America.

引用

页码：312 / 319

页数：8

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