Characterization of diffraction patterns directly from in-line holograms with the fractional Fourier transform

被引：34
|
作者：
Coëtmellec, S [1 ]
Lebrun, D [1 ]
Özkul, C [1 ]
机构：
[1] Unite Mixte Rech Technopole Madrillet, F-76801 St Etienne Du Rouvray, France
来源：
APPLIED OPTICS | 2002年 / 41卷 / 02期
关键词：
D O I：
10.1364/AO.41.000312
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We show that the fractional Fourier transform is a suitable mechanism with which to analyze the diffraction patterns produced by a one-dimensional object because its intensity distribution is partially described by a linear chirp function. The three-dimensional location and the diameter of a fiber can be determined, provided that the optimal fractional order is selected. The effect of compaction of the intensity distribution in the fractional Fourier domain is discussed. A few experimental results are presented. (C) 2002 Optical Society of America.
引用
收藏
页码：312 / 319
页数：8
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