On shear coupled migration of low angle grain boundaries

被引:15
作者
Brandenburg, Jann-Erik [1 ]
Molodov, Dmitri A. [1 ]
机构
[1] Rhein Westfal TH Aachen, Inst Phys Met & Met Phys, D-52056 Aachen, Germany
关键词
Grain boundary migration; Bicrystal; Stress; Shear strain; In-situ investigation; MEDIATED PLASTICITY; SLIDING BEHAVIOR; SYMMETRIC TILT; MOTION; ALUMINUM; AL; DEFORMATION; INCLINATION; ORIENTATION; MAGNESIUM;
D O I
10.1016/j.scriptamat.2019.01.009
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Stress induced migration of symmetric < 110 > tilt grain boundaries with misorientations 6.1 degrees, 10.9 degrees, 14.9 degrees and 19.4 degrees was studied by in situ observations in a scanning electron microscope. The examined boundaries readily moved under an applied stress producing shear strain. The measured coupling factors between normal boundary displacement and produced shear matched geometric predictions. The grain boundary mobility and its temperature dependence were measured and the corresponding migration activation parameters were determined. The obtained values of migration activation enthalpy were in the range between 0.72 and 1.09 eV. (C) 2019 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
引用
收藏
页码:96 / 100
页数:5
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