Development of sputtered AlN thin-film ultrasonic transducers for durable high-temperature applications

被引:12
|
作者
Hou, R. [1 ]
Hutson, D. [1 ]
Kirk, K. J. [1 ]
机构
[1] Univ West Scotland, Microscale Sensors Grp, Sch Engn, Paisley PA1 2BE, Renfrew, Scotland
基金
英国工程与自然科学研究理事会;
关键词
ALUMINUM NITRIDE; GAPO4; GENERATION;
D O I
10.1784/insi.2012.55.6.302
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
This paper presents some of the recent experimental work on developing AlN ultrasonic transducers for high-temperature NDT applications. C-axis oriented AlN films were grown on stainless steel SS316 substrate by RF sputtering deposition. The high-temperature performance and durability of the transducer were examined by pulse-echo experiments after heating to different temperatures. It can be shown that the sputtered AlN film transducer is capable of highly stable and durable performance at 400 degrees C or above, with appropriate choice of substrate, buffer layer, electroding materials and electroding approaches. Experimental evidence also indicates that transducers made of sputtered AlN film and a molybdenum buffer layer on a stainless steel substrate could potentially operate at up to 800 degrees C.
引用
收藏
页码:302 / 307
页数:6
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