Current status of x-ray mask manufacturing at the microlithographic mask development center

被引:2
|
作者
Kimmel, KR [1 ]
Hughes, PJ [1 ]
机构
[1] IBM CORP,MICROELECT DIV,LORAL FED SYST,ESSEX JCT,VT
来源
PHOTOMASK AND X-RAY MASK TECHNOLOGY III | 1996年 / 2793卷
关键词
X-ray mask; X-ray lithography; MMD; Microlithographic Mask Development Center;
D O I
10.1117/12.245250
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
引用
收藏
页码:176 / 187
页数:12
相关论文
共 50 条
  • [31] Highly stiff x-ray mask blank with heat resistance and inertness to chemicals
    Marumoto, K
    Yabe, H
    Aya, S
    Kise, K
    Tanji, S
    Minami, N
    PHOTOMASK AND X-RAY MASK TECHNOLOGY III, 1996, 2793 : 188 - 197
  • [32] Stability and stiffness characteristics of the national X-ray mask standard
    Fisher, AH
    Sprague, MA
    Engelstad, RL
    Laird, DL
    Nash, SC
    EMERGING LITHOGRAPHIC TECHNOLOGIES, 1997, 3048 : 288 - 298
  • [33] Stress relaxation of EB resist for X-ray mask fabrication
    Sasahara, A
    Kumada, T
    Kise, K
    Sumitani, H
    EMERGING LITHOGRAPHIC TECHNOLOGIES IV, 2000, 3997 : 113 - 118
  • [34] Mask and wafer inspection and cleaning for Proximity X-ray Lithography
    Leavey, J
    Mangat, PJS
    EMERGING LITHOGRAPHIC TECHNOLOGIES II, 1998, 3331 : 179 - 188
  • [35] IMPROVEMENT IN RADIATION STABILITY OF SIN X-RAY MASK MEMBRANES
    ARAKAWA, T
    OKUYAMA, H
    YAMASHITA, Y
    OHTA, T
    KUMAR, R
    NODA, S
    HOGA, H
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 1993, 32 (12B): : 5941 - 5946
  • [36] X-RAY MASK INSPECTION USING REPLICATED RESIST PATTERNS
    SEKIMOTO, M
    TSUYUZAKI, H
    OKADA, I
    SHIBAYAMA, A
    MATSUDA, T
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 1994, 33 (12B): : 6913 - 6918
  • [37] Thermal distortion of an X-ray mask for synchrotron radiation lithography
    Yang, JF
    Toyota, E
    Kawachi, S
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1998, 37 (12B): : 6804 - 6807
  • [38] Next Generation Lithography mask development at the NGL mask center of competency
    Lercel, M
    Brooks, C
    Racette, K
    Magg, C
    Lawliss, M
    Caldwell, N
    Jeffer, R
    Collins, K
    Barrett, M
    Nash, S
    Trybendis, M
    Bouchard, L
    19TH ANNUAL SYMPOSIUM ON PHOTOMASK TECHNOLOGY, PTS 1 AND 2, 1999, 3873 : 804 - 813
  • [39] Studies on defect inspectability and printability using programmed-defect X-ray mask
    Watanabe, H
    Kikuchi, Y
    Marumoto, K
    Matsui, Y
    Yabe, H
    Aya, S
    Okada, I
    Takeuchi, N
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1999, 38 (12B): : 7084 - 7089
  • [40] Low-cost X-ray conformal mask using dry film resist
    Shih, WP
    Cheng, Y
    Lin, CY
    Hwang, GJ
    MICROELECTRONIC ENGINEERING, 1998, 40 (01) : 43 - 50