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- [11] X-ray mask defect repair optimization EMERGING LITHOGRAPHIC TECHNOLOGIES III, PTS 1 AND 2, 1999, 3676 : 448 - 454
- [12] Simulation of X-ray mask pattern displacement JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 1996, 35 (12B): : 6469 - 6474
- [13] Printability of programmed x-ray mask defects PHOTOMASK AND X-RAY MASK TECHNOLOGY VI, 1999, 3748 : 479 - 485
- [14] Progress in SiC membrane for X-ray mask PHOTOMASK AND X-RAY MASK TECHNOLOGY VI, 1999, 3748 : 456 - 461
- [15] Mask contamination induced by X-ray exposure JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1998, 37 (12B): : 6808 - 6812
- [16] Analysis of backscattered electron signals in X-ray mask inspection JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2003, 42 (6B): : 3946 - 3949
- [17] Fabrication of the X-Ray Mask using the Silicon Dry Etching JOURNAL OF ADVANCED MECHANICAL DESIGN SYSTEMS AND MANUFACTURING, 2008, 2 (02): : 246 - 251
- [18] X-ray mask replication using a Suss stepper at CXrL EMERGING LITHOGRAPHIC TECHNOLOGIES, 1997, 3048 : 299 - 303
- [19] Mask error factor in proximity X-ray lithography JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2000, 39 (12B): : 6947 - 6951
- [20] X-RAY MASK TECHNOLOGY UTILIZING AN OPTICAL STEPPER JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1991, 30 (11B): : 3070 - 3073