Current status of x-ray mask manufacturing at the microlithographic mask development center

被引:2
|
作者
Kimmel, KR [1 ]
Hughes, PJ [1 ]
机构
[1] IBM CORP,MICROELECT DIV,LORAL FED SYST,ESSEX JCT,VT
来源
PHOTOMASK AND X-RAY MASK TECHNOLOGY III | 1996年 / 2793卷
关键词
X-ray mask; X-ray lithography; MMD; Microlithographic Mask Development Center;
D O I
10.1117/12.245250
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
引用
收藏
页码:176 / 187
页数:12
相关论文
共 50 条
  • [1] X-ray mask fabrication advancement at the Microlithographic Mask Development Center
    Kimmel, KR
    Hughes, PJ
    ELECTRON-BEAM, X-RAY, EUV, AND ION-BEAM SUBMICROMETER LITHOGRAPHIES FOR MANUFACTURING VI, 1996, 2723 : 190 - 197
  • [2] X-ray mask image-placement studies at the Microlithographic Mask Development Center
    Puisto, D
    Lawliss, M
    Faure, T
    Rocque, J
    Kimmel, K
    Benoit, D
    ELECTRON-BEAM, X-RAY, EUV, AND ION-BEAM SUBMICROMETER LITHOGRAPHIES FOR MANUFACTURING VI, 1996, 2723 : 204 - 210
  • [3] Status of x-ray mask development at the IBM Advanced Mask Facility
    Racette, KC
    PHOTOMASK AND X-RAY MASK TECHNOLOGY V, 1998, 3412 : 99 - 105
  • [4] Analysis of x-ray mask distortion
    Tanaka, Y
    Yoshihara, T
    Tsuboi, S
    Fujii, K
    Suzuki, K
    PHOTOMASK AND X-RAY MASK TECHNOLOGY IV, 1997, 3096 : 260 - 268
  • [5] SIMULATION OF X-RAY MASK DISTORTION
    ODA, M
    OHKI, S
    OZAWA, A
    OHKUBO, T
    YOSHIHARA, H
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 1992, 31 (12B): : 4189 - 4194
  • [6] Development of highly accurate X-ray mask with high-density patterns
    Shimada, M
    Tsuchizawa, T
    Uchiyama, S
    Ohkubo, T
    Itabashi, S
    Okada, L
    Ono, T
    Oda, M
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1999, 38 (12B): : 7071 - 7075
  • [7] TA FILM PROPERTIES FOR X-RAY MASK ABSORBERS
    ODA, M
    OZAWA, A
    OHKI, S
    YOSHIHARA, H
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 1990, 29 (11): : 2616 - 2619
  • [8] HIGH-PRECISION X-RAY MASK TECHNOLOGY
    OHKI, S
    YOSHIHARA, H
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 1990, 29 (11): : 2600 - 2604
  • [9] Validation of X-ray lithography and development simulation system for moving mask deep X-ray lithography
    Hirai, Y
    Hafizovic, S
    Matsuzuka, N
    Korvink, JG
    Tabata, O
    JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, 2006, 15 (01) : 159 - 168
  • [10] Properties of polycrystalline diamond as x-ray mask
    Sheu, JT
    Yang, GY
    Huang, BR
    MATERIALS AND DEVICE CHARACTERIZATION IN MICROMACHINING, 1998, 3512 : 173 - 180