Doping Ratio Control of Fluorine-Doped Tin Oxide for a High-Quality Transparent Conducting Electrode

被引:3
|
作者
Kim, Chang-Yeoul [1 ]
Go, Eun-Byul [1 ]
Choi, Jae-Seok [2 ]
Choi, Sung Churl [2 ]
机构
[1] Korea Inst Ceram Engn & Technol, Nanoconvergence Intelligence Mat Team, Soho Ro 10, Jinju Si 660031, Gyeongsangnam D, South Korea
[2] Hanyang Univ, Dept Mat Sci & Engn, Seoul 133791, South Korea
关键词
Transparent Conducting Oxide; Fluorine Doped Tin Oxide; Spray Pyrolysis Deposition; Doping Ratio; Electrical Resistivity; SPRAY-DEPOSITED FLUORINE; SNO2; THIN-FILMS; ELECTRICAL-PROPERTIES; PYROLYSIS; CHLORIDE; SNCL2;
D O I
10.1166/jnn.2016.13503
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Transparent conducting oxides (TCOs) are very important materials for application in flat panel displays, thin-film solar cells, and touch panels. These days, the low-temperature synthesis of TCO thin films is being actively researched for realizing flexible electronics such as displays and solar cells. TCO thin films, mainly tin-doped indium oxide, are normally fabricated by high-vacuum sputtering. However, fluorine-doped tin oxide (FTO) has been in use for thin-film solar cells from the beginning. Our study attempts to lower the deposition temperature of FTO to 250 degrees C, which is suitable for deposition on polyimide substrates. We varied the F/Sn precursor ratio at different deposition temperatures, and found that a low F/Sn ratio of about 0.15 produces the lowest electrical resistivity below 350 degrees C, whereas a F/Sn ratio of 1.5 is obtained at 450 degrees C. At lower temperatures, crystal growth is very slow, and therefore, we should conduct very slow deposition to obtain high-quality TCO thin films.
引用
收藏
页码:11330 / 11334
页数:5
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