Sintering Behavior and Microwave Dielectric Properties of Low-Permittivity SrMgSi2O6Ceramic

Low-permittivity SrMgSi(2)O(6)microwave dielectric ceramics were synthesized via a conventional solid-state reaction method. Further, their sintering behavior as well as structural and microwave dielectric properties were studied. The x-ray diffraction patterns of the SrMgSi(2)O(6)and Sr(2)MgSi(2)O(7)ceramics were compared; both the samples were confirmed to be tetragonal. Meanwhile, the microwave dielectric properties of the samples were related to their microscopic morphology. In addition, the SrMgSi(2)O(6)ceramics had a low sintering temperature of 1125 degrees C; they exhibited good microwave dielectric performances with a relative permittivity of epsilon(r) = 6.7, a quality factorQ x f = 25,800 GHz, and temperature coefficient of the resonator frequency tau(f) = -46 ppm/degrees C. Therefore, the ceramics exhibit potential for application in microwave devices.