High-Energy X-ray Absorption Spectroscopy in Materials Chemistry

被引：3
作者：
Ghigna, Paolo [1 ]
Spinolo, Giorgio
机构：
[1] Univ Pavia, Unita INSTM Pavia, I-27100 Pavia, Italy
来源：
SCIENCE OF ADVANCED MATERIALS | 2015年 / 7卷 / 10期
关键词：
EXAFS; Hard X-rays; In Situ and In Operando Experiments; K-EDGE EXAFS; SHORT-RANGE STRUCTURE; SURFACE ORGANOMETALLIC CHEMISTRY; LOCAL CHEMICAL ENVIRONMENT; FINE-STRUCTURE ANALYSIS; IN-SITU; STRUCTURAL-CHARACTERIZATION; ATOMIC-STRUCTURE; FLUORESCENCE SPECTROMETRY; NANOCRYSTALLINE GD3GA5O12;
D O I：
10.1166/sam.2015.2270
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
Recent advances in X-ray Absorption Spectroscopy ((AS) are discussed with a focus on the use of high-energy X-rays and measurements at the K-edges of heavy elements (atomic number >50). The review addresses advantages and drawbacks of measuring at the K-edges, highlights selected examples of XAS in the highenergy range, and outlines appealing future perspectives on instrumentation, data analysis and applications.
引用
收藏
页码：2216 / 2233
页数：18
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