Effect of Annealing on Dielectric Property in Ni1-xCoxFe2O4 Nanoparticles Synthesized using Albumen (egg white)

被引:7
|
作者
Senthil, S. Marutha [1 ]
Jayaprakash, R. [1 ]
Murthy, S. R. [2 ]
Phani, A. R. [3 ]
Singh, V. N. [4 ]
Govindaraj, G. [5 ]
机构
[1] Sri Ramakrishna Mission Vidyalaya Coll Arts & Sci, Nanotechnol Lab, Dept Phys, Coimbatore 641020, Tamil Nadu, India
[2] Osmania Univ, Dept Phys, Hyderabad 500007, Andhra Pradesh, India
[3] Univ Aquila, Dept Phys, I-67100 Laquila, Italy
[4] Indian Inst Technol, Dept Phys, Thin Film Lab, New Delhi 110016, India
[5] Pondicherry Univ, Dept Phys, Pondicherry 605014, India
关键词
Nanocrystalline; Albumen; Dielectric Constant; Thermal Expansion; Dissipation Factor and Egg White; ELECTRICAL-PROPERTIES; MAGNETIC-PROPERTIES; FERRITE PARTICLES; SPINEL FERRITE; ZN FERRITES; NICKEL; BEHAVIOR; MN; CO; COMPOSITES;
D O I
10.4028/www.scientific.net/JNanoR.6.205
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The nano crystalline nickel-cobalt ferrite using albumen (egg white) is synthesized by thermal evaporation method and its dielectric behaviour is analyzed for different annealing temperatures. The dielectric property of the sample is measured using impedance analyzer in the frequency range 1-100 MHz. The variation of dielectric constant and dissipation factor under different frequency for the samples at different annealing temperature are analyzed. A steady dielectric constant is observed for the sample annealed at 500 degrees C. The dielectric constant obtained for this sample is low and it is in the range of 18.9 to 6.9 for different frequencies. This low value of dielectric constant shows the less interfacial polarization due to high resistivity which may be to the presence of a few Fe 21 ions. It is observed that the dispersion in dielectric constant by varying the annealing temperature is producing an intended result. The presence of constituent phases in Ni1-xCoxFe2O4 is confirmed by X-Ray Diffraction. The particle size for Ni1-xCoxFe2O4 obtained from Scherrer equation is found to be is 30nm. The morphology, particle size and percentage composition of elements are measured by employing Transmission Electron Microscopy (TEM), Scanning Electron Microscopy (SEM) and Energy Dispersive X-Ray Analysis spectrum (EDX).
引用
收藏
页码:205 / 213
页数:9
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