High-Reliability Low-Ag-Content Sn-Ag-Cu Solder Joints for Electronics Applications

被引:89
作者
Shnawah, Dhafer Abdulameer [1 ]
Said, Suhana Binti Mohd [2 ]
Sabri, Mohd Faizul Mohd [1 ]
Badruddin, Irfan Anjum [1 ]
Che, Fa Xing [3 ]
机构
[1] Univ Malaya, Dept Mech Engn, Kuala Lumpur 50603, Malaysia
[2] Univ Malaya, Dept Elect Engn, Kuala Lumpur 50603, Malaysia
[3] ASTAR, Inst Microelect, Singapore 117685, Singapore
关键词
Sn-Ag-Cu solders; low Ag content; minor alloying elements; thermal cycling; drop impact; DROP IMPACT RELIABILITY; LEAD-FREE SOLDERS; THERMAL FATIGUE PROPERTIES; INTERFACIAL INTERMETALLIC COMPOUNDS; SHEAR-STRENGTH EVOLUTION; CHIP-SCALE PACKAGES; LOW-CYCLE FATIGUE; ELECTROLESS NI-P; MECHANICAL-PROPERTIES; TENSILE PROPERTIES;
D O I
10.1007/s11664-012-2145-z
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Sn-Ag-Cu (SAC) alloy is currently recognized as the standard lead-free solder alloy for packaging of interconnects in the electronics industry, and high- Ag-content SAC alloys are the most popular choice. However, this choice has been encumbered by the fragility of the solder joints that has been observed in drop testing as well as the high cost of the Ag itself. Therefore, low-Ag-content SAC alloy was considered as a solution for both issues. However, this approach may compromise the thermal-cycling performance of the solders. Therefore, to enhance the thermal-cycling reliability of low-Ag-content SAC alloys without sacrificing their drop-impact performance, alloying elements such as Mn, Ce, Ti, Bi, In, Sb, Ni, Zn, Al, Fe, and Co were selected as additions to these alloys. However, research reports related to these modified SAC alloys are limited. To address this paucity, the present study reviews the effect of these minor alloying elements on the solder joint reliability of low-Ag-content SAC alloys in terms of thermal cycling and drop impact. Addition of Mn, Ce, Bi, and Ni to low-Ag-content SAC solder effectively improves the thermal-cycling reliability of joints without sacrificing the drop-impact performance. Taking into consideration the improvement in the bulk alloy microstructure and mechanical properties, wetting properties, and growth suppression of the interface intermetallic compound (IMC) layers, addition of Ti, In, Sb, Zn, Al, Fe, and Co to low-Ag-content SAC solder has the potential to improve the thermal-cycling reliability of joints without sacrificing the drop-impact performance. Consequently, further investigations of both thermal-cycling and drop reliability of these modified solder joints must be carried out in future work.
引用
收藏
页码:2631 / 2658
页数:28
相关论文
共 189 条
  • [21] Effects of minor additions of Zn on interfacial reactions of Sn-Ag-Cu and Sn-Cu solders with various Cu substrates during thermal aging
    Cho, Moon Gi
    Kang, Sung K.
    Shih, Da-Yuan
    Lee, Hyuck Mo
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 2007, 36 (11) : 1501 - 1509
  • [22] Drop impact reliability testing for lead-free and lead-based soldered IC packages
    Chong, Desmond Y. R.
    Che, F. X.
    Pang, John H. L.
    Ng, Kellin
    Tan, Jane Y. N.
    Low, Patrick T. H.
    [J]. MICROELECTRONICS RELIABILITY, 2006, 46 (07) : 1160 - 1171
  • [23] Effect of microelements addition on the interfacial reaction between Sn-Ag-Cu solders and the Cu substrate
    Chuang, CM
    Lin, KL
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 2003, 32 (12) : 1426 - 1431
  • [24] Inhibition of Whisker Growth on the Surface of Sn-3Ag-0.5Cu-0.5Ce Solder Alloyed with Zn
    Chuang, Tung-Han
    Lin, Hsiu-Jen
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 2009, 38 (03) : 420 - 424
  • [25] Effect of heat treatment on the electrical resistivity of near-eutectic Sn-Ag-CuPb-free solder alloys
    Cook, BA
    Anderson, IE
    Harringa, JL
    Terpstra, RL
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 2002, 31 (11) : 1190 - 1194
  • [26] The influence of low level doping on the thermal evolution of SAC alloy solder joints with Cu pad structures
    de Sousa, Isabel
    Henderson, Donald W.
    Patry, Luc
    Kang, Sung K.
    Shih, D. -Y.
    [J]. 56TH ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE 2006, VOL 1 AND 2, PROCEEDINGS, 2006, : 1454 - +
  • [27] Microstructural coarsening in Sn-Ag-based solders and its effects on mechanical properties
    Dutta, I.
    Kumar, P.
    Subbarayan, G.
    [J]. JOM, 2009, 61 (06) : 29 - 38
  • [28] Microstructure and In Situ Observations of Undercooling for Nucleation of β-Sn Relevant to Lead-Free Solder Alloys
    Elmer, John W.
    Specht, Eliot D.
    Kumar, Mukul
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 2010, 39 (03) : 273 - 282
  • [30] Microstructural development of Sn-Ag-Cu solder joints
    Fix, AR
    López, GA
    Brauer, I
    Nüchter, W
    Mittemeijer, EJ
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 2005, 34 (02) : 137 - 142