Effect of the MOSFET Choice on Conducted EMI in Power Converter Circuits

被引:0
作者
Slama, Jaleleddine Ben Hadj [1 ]
Tlig, Mohamed [1 ]
机构
[1] Univ Sousse, SAGE, Natl Engn Sch Sousse ENISO, Sousse, Tunisia
来源
2012 16TH IEEE MEDITERRANEAN ELECTROTECHNICAL CONFERENCE (MELECON) | 2012年
关键词
EMC; LSIN; Model; Interferences; Mosfet;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The phase of virtual prototyping, which is usually based on a whole of numerical simulations of the system, requires today to have thin suitable models. These models must take in account the real behavior of the systems under various physical constraints (thermal, electromagnetic...). Particularly, in this work, we are interested to the study of the effect of the Mosfet transistor choice on the conducted electromagnetic interferences emitted by static converters circuits. The objective of this work is to propose a new design methodology which will permit to assist the power electronics circuit designer in the choice of the active components with the purpose of reducing the electromagnetic disturbances.
引用
收藏
页码:610 / 613
页数:4
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