Probing attractive forces at the nanoscale using higher-harmonic dynamic force microscopy

被引:52
作者
Crittenden, S [1 ]
Raman, A
Reifenberger, R
机构
[1] Purdue Univ, Dept Phys, W Lafayette, IN 47907 USA
[2] Purdue Univ, Sch Mech Engn, W Lafayette, IN 47907 USA
[3] Purdue Univ, Birck Nanotechnol Ctr, W Lafayette, IN 47907 USA
关键词
D O I
10.1103/PhysRevB.72.235422
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We systematically investigate higher harmonics in the vibration spectrum of scanning force microscope cantilevers operating in the attractive regime. We show that (a) the magnitudes of the higher-harmonic signals in the vibration spectrum should be directly correlated to the local van der Waals forces for systems without significant electrostatic interactions and (b) the higher-harmonic resonances are much sharper than the fundamental harmonic. Consequently, and unlike the case of the tapping mode operation, contrast in the amplitudes of the higher harmonics over a scanned sample with small electrostatic forces reflects changes in specific chemical composition. Dynamic force-distance curves and higher-harmonic images are presented to demonstrate contrast between biological macromolecules deposited on a mica substrate. The results suggest that the systematic measurement of higher harmonics in the attractive regime can lead to highly sensitive techniques to map the chemical composition over heterogeneous samples.
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页数:13
相关论文
共 51 条
[11]   Dynamics of the cantilever in noncontact dynamic force microscopy: The steady-state approximation and beyond [J].
Gauthier, M ;
Sasaki, N ;
Tsukada, M .
PHYSICAL REVIEW B, 2001, 64 (08)
[12]   Force microscopy with light-atom probes [J].
Hembacher, S ;
Giessibl, FJ ;
Mannhart, J .
SCIENCE, 2004, 305 (5682) :380-383
[13]   Higher-harmonics generation in tapping-mode atomic-force microscopy: Insights into the tip-sample interaction [J].
Hillenbrand, R ;
Stark, M ;
Guckenberger, R .
APPLIED PHYSICS LETTERS, 2000, 76 (23) :3478-3480
[14]   Theoretical description of the transfer of vibrations from a sample to the cantilever of an atomic force microscope [J].
Hirsekorn, S ;
Rabe, U ;
Arnold, W .
NANOTECHNOLOGY, 1997, 8 (02) :57-66
[15]   Determination of tip-sample interaction potentials by dynamic force spectroscopy [J].
Hölscher, H ;
Allers, W ;
Schwarz, UD ;
Schwarz, A ;
Wiesendanger, R .
PHYSICAL REVIEW LETTERS, 1999, 83 (23) :4780-4783
[16]   Frequency domain identification of tip-sample van der Waals interactions in resonant atomic force microcantilevers [J].
Hu, SQ ;
Howell, S ;
Raman, A ;
Reifenberger, R ;
Franchek, M .
JOURNAL OF VIBRATION AND ACOUSTICS-TRANSACTIONS OF THE ASME, 2004, 126 (03) :343-351
[17]   Measurement of Young's modulus of nanocrystalline ferrites with spinel structures by atomic force acoustic microscopy [J].
Kester, E ;
Rabe, U ;
Presmanes, L ;
Tailhades, P ;
Arnold, W .
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 2000, 61 (08) :1275-1284
[18]  
Khalil HK., 2002, Nonlinear Systems, V3
[19]   Electrostatic forces in atomic force microscopy [J].
Law, BM ;
Rieutord, F .
PHYSICAL REVIEW B, 2002, 66 (03) :354021-354026
[20]   Nonlinear dynamic perspectives on dynamic force microscopy [J].
Lee, SI ;
Howell, SW ;
Raman, A ;
Reifenberger, R .
ULTRAMICROSCOPY, 2003, 97 (1-4) :185-198