Structure of thin films of poly(3,4-ethylenedioxythiophene)

被引：372

作者：

Aasmundtveit, KE ^{[1
]}

Samuelsen, EJ

Pettersson, LAA

Inganäs, O

Johansson, T

Feidenhans, R

机构：

[1] Norges Teknisk Naturvitenskaplige Univ, Inst Fys, N-7034 Trondheim, Norway

[2] Linkoping Univ, Inst Fys Och Mattek, S-58183 Linkoping, Sweden

[3] Forskningsctr Riso, DK-4000 Roskilde, Denmark

来源：

SYNTHETIC METALS | 1999年 / 101卷 / 1-3期

关键词：

polythiophene and derivatives; X-ray diffraction; polycrystalline thin films; low-bandgap conjugated polymers;

D O I：

10.1016/S0379-6779(98)00315-4

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Thin films (50-400 nm) of tosylate-doped poly(3,4-ethylene-dioxy-thiophene) (PEDOT) on various substrates have been studied by grazing incidence X-ray diffraction, using synchrotron radiation. The material was found to be highly anisotropic. This is correlated with a strong anisotropy observed in its optical and electronic properties. The crystalline order is limited, and evidence is found for a paracrystalline structure. A structural model is presented, which corroborates with the optical anisotropy. The effect of heating the material to 200 degrees C was studied. Unlike the situation for other substituted polythiophenes, heating PEDOT increases the crystalline order.

引用

页码：561 / 564

页数：4

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