Three-dimensional topography measurement with triangular beam scanning technique

被引：1
作者：
Jiang, JF [1 ]
He, YH [1 ]
Zhao, WS [1 ]
机构：
[1] Harbin Inst Technol, Mech Engn Dept 421, Harbin 150001, Peoples R China
来源：
ROUGH SURFACE SCATTERING AND CONTAMINATION | 1999年 / 3784卷
关键词：
three-dimensional topography measurement; triangular beam scanning; light-section method; light scanning technique; non-contact measurement; edge detection; digital image processing; threshold; binary image; anti-interference;
D O I：
10.1117/12.366699
中图分类号：
V [航空、航天];
学科分类号：
08 ; 0825 ;
摘要：
This paper presents a system for three-dimensional topography measurement, of both smooth and rough surface, based on triangular beam scanning technique. This system utilizes a simple but efficient principle based on the general principle of light-section method and the idea of light scanning technique to acquire topography. Its ability of anti-interference is powerful and it can be used at locale of manufacturing.
引用
收藏
页码：354 / 361
页数：8
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