Contact-Engineered Electrical Properties of MoS2 Field-Effect Transistors via Selectively Deposited Thiol-Molecules

被引:69
作者
Cho, Kyungjune [1 ,2 ]
Pak, Jinsu [1 ,2 ]
Kim, Jae-Keun [1 ,2 ]
Kang, Keehoon [1 ,2 ]
Kim, Tae-Young [1 ,2 ]
Shin, Jiwon [1 ,2 ]
Choi, Barbara Yuri [1 ,2 ]
Chung, Seungjun [3 ]
Lee, Takhee [1 ,2 ]
机构
[1] Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South Korea
[2] Seoul Natl Univ, Inst Appl Phys, Seoul 08826, South Korea
[3] Korea Inst Sci & Technol, Photoelect Hybrids Res Ctr, Seoul 02792, South Korea
基金
新加坡国家研究基金会;
关键词
charge injection; contact engineering; electrical transport; MoS2; thiol-molecules; MONOLAYER MOS2; SULFUR VACANCIES; LAYER MOS2; MOS2(0001); ADSORPTION; BN;
D O I
10.1002/adma.201705540
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Although 2D molybdenum disulfide (MoS2) has gained much attention due to its unique electrical and optical properties, the limited electrical contact to 2D semiconductors still impedes the realization of high-performance 2D MoS2-based devices. In this regard, many studies have been conducted to improve the carrier-injection properties by inserting functional paths, such as graphene or hexagonal boron nitride, between the electrodes and 2D semiconductors. The reported strategies, however, require relatively time-consuming and low-yield transfer processes on sub-micrometer MoS2 flakes. Here, a simple contact-engineering method is suggested, introducing chemically adsorbed thiol-molecules as thin tunneling barriers between the metal electrodes and MoS2 channels. The selectively deposited thiol-molecules via the vapor-deposition process provide additional tunneling paths at the contact regions, improving the carrier-injection properties with lower activation energies in MoS2 field-effect transistors. Additionally, by inserting thiol-molecules at the only one contact region, asymmetric carrier-injection is feasible depending on the temperature and gate bias.
引用
收藏
页数:8
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