In situ characterization of pin diode waveforms using electro-optic sampling

被引：0

作者：

Benabe, Evelyn ^{[1
]}

Crites, Matthew H. ^{[2
]}

Whitaker, John F. ^{[2
]}

Weller, Thomas M. ^{[1
]}

机构：

[1] Univ S Florida, Tampa, FL 33620 USA

[2] Univ Michigan, Ann Arbor, MI 48109 USA

来源：

MICROWAVE AND OPTICAL TECHNOLOGY LETTERS | 2012年 / 54卷 / 11期

基金：

美国国家科学基金会;

关键词：

electro-optic sampling; nonlinear; PIN diode; time-domain; INTEGRATED-CIRCUITS;

D O I：

10.1002/mop.27119

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In situ measurements of nonlinear waveforms produced by a PIN diode under large-signal excitation have been performed using ultrafast electro-optic (EO) sampling.The waveforms were sampled using an EO probe positioned immediately after the diode. These data validate a nonlinear model and improve representation of the waveform across the circuit. (c) 2012 Wiley Periodicals, Inc. Microwave Opt Technol Lett 54:2653-2656, 2012; View this article online at wileyonlinelibrary.com. DOI 10.1002/mop.27119

引用

页码：2653 / 2656

页数：4

共 5 条

[1]

Iordanescu S., 1998, SEM C 1998 CAS 98 P, V2, P601

[2] Stable optoelectronic detection of free-running microwave signals with 150-GHz bandwidth [J].