High-Speed X-ray Phase Tomography with Talbot Interferometer and Fringe Scanning Method

被引：12

作者：

Kibayashi, Shunsuke ^{[1
]}

Harasse, Sebastien ^{[2
]}

Yashiro, Wataru ^{[2
]}

Momose, Atsushi ^{[2
]}

机构：

[1] Univ Tokyo, Dept Appl Phys, Fac Engn, 5-1-5 Kashiwanoha, Kashiwa, Chiba 2778561, Japan

[2] Univ Tokyo, Grad Sch Frontier Sci, Dept Adv Mat Sci, Tokyo 1138654, Japan

来源：

INTERNATIONAL WORKSHOP ON X-RAY AND NEUTRON PHASE IMAGING WITH GRATINGS | 2012年 / 1466卷

基金：

日本科学技术振兴机构;

关键词：

Phase imaging; Grating; Interferometer; Talbot interferometer; Tomography; Time resolved observation; WHITE SYNCHROTRON-RADIATION;

D O I：

10.1063/1.4742302

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

High-speed X-ray phase tomography based on the Fourier-transform method has been demonstrated with an X-ray Talbot interferometer using white synchrotron radiation. We report the experimental results of high-speed X-ray phase tomography with fringe-scanning method instead of Fourier-transform method to improve spatial resolution without a considerable increase of scan time. To apply fringe-scanning method to high speed tomography, we tested a scan that is a synchronous combination of one-way continuous movements of the sample rotation and the grating displacement. When this scanning method was combined with X-ray phase tomography, we were able to obtain a scan time of 5 s. A comparison of the image quality derived with the conventional approach and with the proposed approach using the fringe-scanning method showed that the latter had better spatial resolution.

引用

页码：261 / 265

页数：5

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