Constant Loss Contours of Matching Networks for Millimeter-Wave LNA Design

被引：6

作者：

Ko, Chun-Lin ^{[1
]}

Li, Chun-Hsing ^{[2
]}

Kuo, Ming-Ching ^{[3
]}

Chang, Da-Chiang ^{[1
]}

机构：

[1] Natl Chip Implementat Ctr CIC, Natl Appl Res Labs, Hsinchu 300, Taiwan

[2] Natl Cent Univ, Dept Elect Engn, Chungli 320, Taiwan

[3] ITRI, Informat & Commun Res Lab ICL, Hsinchu 310, Taiwan

来源：

IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS | 2016年 / 26卷 / 11期

关键词：

Impedance matching; low-noise amplifiers; matching network loss;

D O I：

10.1109/LMWC.2016.2614971

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This letter presents a new tool of constant loss contours for matching network loss evaluation. With a certain source impedance, the contours illustrate the matching loss while an arbitrary load impedance is matched to the source impedance. The contours are also applied to millimeter-wave circuit design to help designers consider the circuit topologies, transistor sizes, and layout effects. A millimeter-wave CMOS low-noise amplifier has been optimized by using the constant loss contours. The measured results show a low noise figure of 4.85 dB and a gain of 21.0 dB at 79.5 GHz while only consuming 8 mW from a 1.0 V supply.

引用

页码：942 / 944

页数：3

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