Electron-impact ionization of moderately charged xenon ions

被引：10

作者：

Pindzola, M. S. ^{[1
]}

Loch, S. D. ^{[1
]}

Borovik, A., Jr. ^{[2
]}

Gharaibeh, M. F. ^{[2
,3
]}

Rudolph, J. K. ^{[2
]}

Schippers, S. ^{[2
]}

Mueller, A. ^{[2
]}

机构：

[1] Auburn Univ, Dept Phys, Auburn, AL 36849 USA

[2] Univ Giessen, Inst Atom & Mol Phys, D-35392 Giessen, Germany

[3] Jordan Univ Sci & Technol, Dept Phys, Irbid 22110, Jordan

来源：

JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS | 2013年 / 46卷 / 21期

基金：

美国国家科学基金会;

关键词：

ABSOLUTE CROSS-SECTIONS; MULTIPLE IONIZATION; SINGLE IONIZATION; GAS IONS; COLLISION; XE-6+; AR-2+; NE-2+; KR-2+; AR+;

D O I：

10.1088/0953-4075/46/21/215202

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Absolute and energy scanned cross sections for the electron-impact single ionization of Xeq+ (q = 10-17) atomic ions are measured by employing a crossed-beams technique in the collision energy range from threshold to 1000 eV. Direct ionization and indirect excitation-autoionization cross sections are calculated using a configuration-average distorted-wave method for the ground and first same parity excited configuration of the Xeq+ (q = 10-17) atomic ions. Both the crossed-beams experiment and distorted-wave theory show a steady decrease in the ionization cross section as the charge of the ion increases. The disagreements between experiment and theory are partly attributed to the many metastable levels of ground and excited configurations found in the ion beam.

引用

页数：6

共 45 条

[1] SINGLE IONIZATION OF MULTIPLY CHARGED XENON IONS BY ELECTRON-IMPACT [J].