Kelvin probe force microscopy of molecular surfaces

被引：131

作者：

Fujihira, M ^{[1
]}

机构：

[1] Tokyo Inst Technol, Dept Biomol Engn, Midori Ku, Yokohama, Kanagawa 2668501, Japan

来源：

ANNUAL REVIEW OF MATERIALS SCIENCE | 1999年 / 29卷

关键词：

electrostatic force microscopy (EFM); scanning Maxwell stress microscopy (SMM); scanning surface potential microscopy (SSPM); Langmuir-Blodgett (LB) films; contact potential difference (CPD); work functions; molecular photodiode;

D O I：

10.1146/annurev.matsci.29.1.353

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The electrostatic force microscope is one of many specialized tip sensors used in near-field microscopy. This type of microscope is realized by applying a voltage on a conducting AFM tip. It can be used to image samples that present a distribution of electrical properties on inhomogeneous materials as well as on nanostructures. This microscopy technique has been used to probe phase separation, chemical recognition, molecular orientation, and photo-induced charge separation in molecular photodiodes in Langmuir-Blodgett films.

引用

页码：353 / 380

页数：28

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