MultiRef: software platform for Rietveld refinement of multiple powder diffractograms from in situ, scanning or diffraction tomography experiments

被引:18
作者
Frolich, Simon [1 ,2 ]
Birkedal, Henrik [1 ,2 ]
机构
[1] Aarhus Univ, Dept Chem, 14 Gustav Wieds Vej, DK-8000 Aarhus, Denmark
[2] Aarhus Univ, iNANO, 14 Gustav Wieds Vej, DK-8000 Aarhus, Denmark
关键词
multiple Rietveld refinements; powder X-ray diffraction; MultiRef; automated Rietveld refinement; computer programs; COMPUTED-TOMOGRAPHY; ANOMIA; GROWTH; BYSSUS;
D O I
10.1107/S1600576715020099
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Modern advanced diffraction experiments such as in situ diffraction, position-resolved diffraction or diffraction tomography generate extremely large data sets with hundreds to many thousands of diffractograms. Analyzing such data sets by Rietveld refinement is hampered by the logistics of running the Rietveld refinement program, extracting and analyzing the results, and possibly re-refining the data set based on an analysis of the preceding cycle of refinements. The complexity of the analysis may prevent some researchers either from performing the experiments or from conducting an exhaustive analysis of collected data. To this end, a MATLAB framework, MultiRef, which facilitates automated refinements, data extraction and intelligent choice of refinement model based on user choices, has been developed The use of MultiRef is illustrated on data sets from diffraction tomography, position-resolved diffraction and in situ powder diffraction investigations of crystallization.
引用
收藏
页码:2019 / 2025
页数:7
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