Cryogen-Free Operation of 10 V Programmable Josephson Voltage Standards

被引:20
作者
Howe, L. [1 ]
Burroughs, C. J. [2 ]
Dresselhaus, P. D. [2 ]
Benz, S. P. [2 ]
Schwall, R. E. [2 ]
机构
[1] Univ Colorado, Boulder, CO 80309 USA
[2] NIST, Boulder, CO 80305 USA
关键词
Josephson arrays; primary standards; superconducting device packaging; thermal conductance; voltage; 4; K; SOLDERS;
D O I
10.1109/TASC.2012.2230052
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Given the recent shortages of liquid helium, cryogen-free operation of superconducting devices, such as programmable Josephson voltage standard (PJVS) systems, has become preferable worldwide, and a necessity in some locations. However, reliable operation on a cryocooler is heavily dependent on the ability to create a constant temperature that is low enough to allow the PJVS junctions to operate uniformly. In this work, we systematically investigated as a function of temperature the performance of NIST 10 V PJVS chips employing Nb/NbxSi1-x/Nb superconducting junctions. Additionally, we addressed the major factors limiting the performance of a cryocooled PJVS: adequate attenuation of the coldhead temperature oscillations and the minimization thermal gradients between the chip and the cryocooler. Through the development of a robust and reproducible method for soldering chips to a Cu carrier (package), we increased the thermal conductances within the packaging to their practical maximum values. This, in addition to the incorporation of a passive two-stage thermal filter, allows us to confidently predict that the required cooling power for the successful cryogen-free operation of the NIST 10 V PJVS is similar to 0.5 W at 4 K.
引用
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页数:5
相关论文
共 20 条
[1]  
Allweins K, 2008, AIP CONF PROC, V985, P109
[2]   Accuracy of a cryocooler-based programmable Josephson voltage standard [J].
Behr, R ;
Schubert, M ;
May, T .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2004, 53 (03) :822-825
[3]   Application of the Josephson effect to voltage metrology [J].
Benz, SP ;
Hamilton, CA .
PROCEEDINGS OF THE IEEE, 2004, 92 (10) :1617-1629
[4]   NIST 10 V Programmable Josephson Voltage Standard System [J].
Burroughs, Charles J., Jr. ;
Dresselhaus, Paul D. ;
Ruefenacht, Alain ;
Olaya, David ;
Elsbury, Michael M. ;
Tang, Yi-Hua ;
Benz, Samuel P. .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2011, 60 (07) :2482-2488
[5]   THERMAL CONDUCTANCE IN SCREW-FASTENED JOINTS AT HELIUM TEMPERATURES [J].
DEUTSCH, M .
CRYOGENICS, 1979, 19 (05) :273-274
[6]   Tapered Transmission Lines With Dissipative Junctions [J].
Dresselhaus, Paul D. ;
Elsbury, Michael M. ;
Benz, Samuel P. .
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 2009, 19 (03) :993-998
[7]   Broadband Lumped-Element Integrated N-Way Power Dividers for Voltage Standards [J].
Elsbury, Michael M. ;
Dresselhaus, Paul D. ;
Bergren, Norman F. ;
Burroughs, Charles J. ;
Benz, Samuel P. ;
Popovic, Zoya .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2009, 57 (08) :2055-2063
[8]  
Hands B.A., 1986, CRYOGENIC ENG
[9]  
Li R., 1996, 9 INT CRYOC C JUN 25
[10]  
Maruyama M, 2010, 2010 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS CPEM, P8, DOI 10.1109/CPEM.2010.5544216