共 38 条
[8]
Application software for data analysis for three-dimensional atom probe microscopy
[J].
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING,
2002, 327 (01)
:29-33
[9]
Hellman OC, 2000, MICROSC MICROANAL, V6, P437, DOI 10.1007/s100050010051
[10]
ON THE NATURE, CHARACTERIZATION AND APPLICATIONS OF POINT-DEFECTS IN INSULATORS
[J].
RADIATION EFFECTS AND DEFECTS IN SOLIDS,
1982, 64 (1-4)
:35-47