A 17.5-26 GHz Low-Noise Amplifier With Over 8 kV ESD Protection in 65 nm CMOS

被引:27
作者
Tsai, Ming-Hsien [1 ,2 ,3 ]
Hsu, Shawn S. H. [1 ,2 ]
Hsueh, Fu-Lung [3 ]
Jou, Chewn-Pu [3 ]
Yeh, Tzu-Jin [3 ]
机构
[1] Natl Tsing Hua Univ, Dept Elect Engn, Hsinchu, Taiwan
[2] Natl Tsing Hua Univ, Inst Elect Engn, Hsinchu, Taiwan
[3] Taiwan Semicond Mfg Co Ltd, Hsinchu, Taiwan
关键词
CMOS; electrostatic discharge; human-body-model (HBM); low-noise amplifier (LNA); radio frequency (RF); LOW-POWER; LNA;
D O I
10.1109/LMWC.2012.2212239
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
By the electrostatic discharge (ESD)/matching co-design methodology, a wideband low-noise amplifier (LNA) using a grounded spiral inductor in conjunction with a MOM capacitor for ESD protection and wideband matching is demonstrated in a 65 nm CMOS. The shunt inductor provides an effective bidirectional ESD protection to the ground and the series capacitor greatly enhances the breakdown level in the current discharge path. The measurement results demonstrate an over 8 kV human-body-model ESD protection level with almost no RF characteristic degradation after ESD zapping. Under a power consumption of 5.6 mW, the ESD-protected LNA presents a flat NF and power gain of 3.3-3.9 dB and 16.6-17.9 dB, respectively, in the frequency range of 18.5-24.5 GHz, and a 3 dB bandwidth of 17.5-26 GHz is achieved.
引用
收藏
页码:483 / 485
页数:3
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