Constriction Resistance of Thin Film Contacts

被引:6
|
作者
Timsit, R. S. [1 ]
机构
[1] Timron Adv Connector Technol, Toronto, ON M5M 1L6, Canada
关键词
contact resistance; spreading resistance; electrical contacts; thin films;
D O I
10.1109/HOLM.2008.ECP.64
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The electrical constriction resistance of a circular a-spot in a bulk interface stems from convergence of electrical current flow lines from a distance far from the constriction, and the subsequent spreading out of the current from the constriction. The spreading resistance of an a-spot located in a thin film cannot be identical to that generated in a bulk component of the same material since current spreading is limited in a thin film. This paper addresses the effect of film thickness on spreading resistance, and hence on constriction resistance, in a thin conducting layer. It is shown that the spreading resistance of a circular constriction of radius a located in a cylindrical film of outer radius b and thickness L may be written as R-N (rho / 4a), where R-N is a factor that depends on the ratio L/b and a/b. Calculations indicate that RN deviates from 1 i.e. spreading resistance deviates significantly from that in a bulk solid, only for relatively thin film where L/b is small and for relatively large values of a/b.
引用
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页码:332 / 336
页数:5
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