Microstructure and electrochemical behavior of sputtered diamond-like carbon films

被引:7
作者
Zeng, A
Liu, E
Hing, P
Zhang, S
Tan, SN
Annergren, IF
Gao, J
机构
[1] Nanyang Technol Univ, Sch Mech & Prod Engn, Singapore 639798, Singapore
[2] Nanyang Technol Univ, Sch Mat Engn, Singapore 639798, Singapore
[3] Nanyang Technol Univ, Natl Inst Educ, Singapore 637616, Singapore
[4] Gint Inst Mfg Technol, Singapore 638075, Singapore
来源
INTERNATIONAL JOURNAL OF MODERN PHYSICS B | 2002年 / 16卷 / 6-7期
关键词
D O I
10.1142/S0217979202010804
中图分类号
O59 [应用物理学];
学科分类号
摘要
Diamond-like carbon (DLC) films with different structure were deposited on highly electrically conductive silicon substrates (SiO2/Si), using dc magnetron sputtering deposition process. Their structure and electrochemical behavior in 0.5 M H2SO4 Solution were studied with micro-Raman spectroscopy, electrochemical impedance spectroscopic (EIS) analysis and film impedance. The double layer capacitance on the DLC films was about 0.571 - 3.91 muF-cm(2). The capacitance increased with the increased Raman spectrum intensity ratio I-D/I-G and accelerated at around 2.25 of the ratio. The results suggest that the potential of DLC films as electrode materials for electrochemical analysis.
引用
收藏
页码:1024 / 1030
页数:7
相关论文
共 22 条
[1]   Improvement of the thermal stability of amorphous carbon films by incorporation of nitrogen [J].
Bai, HL ;
Jiang, EY .
THIN SOLID FILMS, 1999, 353 (1-2) :157-165
[2]   A NONLINEAR LEAST-SQUARES FIT PROCEDURE FOR ANALYSIS OF IMMITTANCE DATA OF ELECTROCHEMICAL SYSTEMS [J].
BOUKAMP, BA .
SOLID STATE IONICS, 1986, 20 (01) :31-44
[3]   ELECTROCONDUCTIVITY OF AMORPHOUS-CARBON FILMS CONTAINING SILICON AND TUNGSTEN [J].
BOZHKO, A ;
IVANOV, A ;
BERRETTONI, M ;
CHUDINOV, S ;
STIZZA, S ;
DORFMAN, V ;
PYPKIN, B .
DIAMOND AND RELATED MATERIALS, 1995, 4 (04) :488-491
[4]   Improvement of the corrosion resistance of C/Al-composites by diamond-like carbon coatings [J].
Dorner, A ;
Wielage, B ;
Schürer, C .
THIN SOLID FILMS, 1999, 355 :214-218
[5]   Mechanical properties and corrosion studies of amorphous carbon on magnetic disks prepared by ECR plasma technique [J].
Fung, MK ;
Lai, KH ;
Chan, CY ;
Bello, I ;
Lee, CS ;
Lee, ST ;
Mao, DS ;
Wang, X .
THIN SOLID FILMS, 2000, 368 (02) :198-202
[6]   ROLE OF DC SELF-BIAS POTENTIAL IN CONTROL OF RF SPUTTERING [J].
LAMONT, LT ;
TURNER, FT .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1974, 11 (01) :47-51
[7]   A study of microstructural and electrochemical properties of ultra-thin DLC coatings on AlTiC substrates deposited using the ion beam technique [J].
Liu, ZH ;
Zhao, JF ;
McLaughlin, J .
DIAMOND AND RELATED MATERIALS, 1999, 8 (01) :56-63
[8]   Hydrogen and oxygen evolution on boron-doped diamond electrodes [J].
Martin, HB ;
Argoitia, A ;
Landau, U ;
Anderson, AB ;
Angus, JC .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1996, 143 (06) :L133-L136
[9]   HYDROGEN-FREE AMORPHOUS-CARBON PREPARATION AND PROPERTIES [J].
MCKENZIE, DR ;
YIN, Y ;
MARKS, NA ;
DAVIS, CA ;
PAILTHORPE, BA ;
AMARATUNGA, GAJ ;
VEERASAMY, VS .
DIAMOND AND RELATED MATERIALS, 1994, 3 (4-6) :353-360
[10]   High rate deposition of ta-C:H using an electron cyclotron wave resonance plasma source [J].
Morrison, NA ;
Rodil, SE ;
Ferrari, AC ;
Robertson, J ;
Milne, WI .
THIN SOLID FILMS, 1999, 337 (1-2) :71-73