Graphene-Coated Atomic Force Microscope Tips for Reliable Nanoscale Electrical Characterization

被引：62
作者：
Lanza, M. [1 ]
Bayerl, A. [2 ]
Gao, T. [3 ]
Porti, M. [2 ]
Nafria, M. [2 ]
Jing, G. Y. [4 ]
Zhang, Y. F. [3 ]
Liu, Z. F. [3 ]
Duan, H. L. [1 ]
机构：
[1] Peking Univ, Coll Engn, State Key Lab Turbulence & Complex Syst, Dept Mech & Aerosp Engn,CAPT, Beijing 100871, Peoples R China
[2] Univ Autonoma Barcelona, Dept Elect Engn, Cerdanyola Del Valles 08193, Spain
[3] Peking Univ, Acad Adv Interdisciplinary Studies, State Key Lab Struct Chem Unstable & Stable Speci, Beijing Natl Lab Mol Sci,Ctr Nanochem CNC,Coll Ch, Beijing 100871, Peoples R China
[4] NW Univ Xian, Dept Phys, Xian 710069, Peoples R China
来源：
ADVANCED MATERIALS | 2013年 / 25卷 / 10期
基金：
中国国家自然科学基金;
关键词：
graphene; atomic force microscopy; tip wearing; electrochemical metallization; chemical vapor deposition; THIN; SIO2-FILMS;
D O I：
10.1002/adma.201204380
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
Graphene single-layer films are grown by chemical vapor deposition and transferred onto commercially available conductive tips for atomic force microscopy. Graphene-coated tips are much more resistant to both high currents and frictions than commercially available, metal-varnished, conductive atomic force microscopy tips, leading to much larger lifetimes and more reliable imaging due to a lower tip-sample interaction. © 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
引用
收藏
页码：1440 / 1444
页数：5
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