Finite element simulation of the chronoamperometric response of recessed and protruding microdisc electrodes

被引：55

作者：

Ferrigno, R ^{[1
]}

Brevet, PF ^{[1
]}

Girault, HH ^{[1
]}

机构：

[1] ECOLE POLYTECH FED LAUSANNE,LAB ELECTROCHIM,CH-1015 LAUSANNE,SWITZERLAND

来源：

ELECTROCHIMICA ACTA | 1997年 / 42卷 / 12期

关键词：

recessed microdisc; protruding microdisc; numerical simulation; finite elements; chronoamperometric response;

D O I：

10.1016/S0013-4686(96)00402-1

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

The chronoamperometric and steady-state responses of both recessed and protruding microdisc electrodes have been evaluated by numerical simulation using a commercial finite element software package. (C) 1997 Elsevier Science Ltd.

引用

页码：1895 / 1903

页数：9

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