Nanopipette/Nanorod-Combined Quartz Tuning Fork-Atomic Force Microscope

被引：7
作者：
An, Sangmin [1 ]
Jhe, Wonho [1 ]
机构：
[1] Seoul Natl Univ, Dept Phys Astron, Seoul 08826, South Korea
来源：
SENSORS | 2019年 / 19卷 / 08期
基金：
新加坡国家研究基金会;
关键词：
nanopipette; nanorod; QTF-AFM; nanolithography; nanoscratching;
D O I：
10.3390/s19081794
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
We introduce a nanopipette/quartz tuning fork (QTF)-atomic force microscope (AFM) for nanolithography and a nanorod/QTF-AFM for nanoscratching with in situ detection of shear dynamics during performance. Capillary-condensed nanoscale water meniscus-mediated and electric field-assisted small-volume liquid ejection and nanolithography in ambient conditions are performed at a low bias voltage (10 V) via a nanopipette/QTF-AFM. We produce and analyze Au nanoparticle-aggregated nanowire by using nanomeniscus-based particle stacking via a nanopipette/QTF-AFM. In addition, we perform a nanoscratching technique using in situ detection of the mechanical interactions of shear dynamics via a nanorod/QTF-AFM with force sensor capability and high sensitivity.
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页数：12
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