Low Inductance Switching for SiC MOSFET Based Power Circuit

被引:0
|
作者
Shelton, Edward [1 ]
Zhang, Xueqiang [1 ]
Zhang, Tianqi [1 ]
Hari, Nikita [1 ]
Palmer, Patrick [1 ]
机构
[1] Univ Cambridge, Dept Engn, Cambridge, England
来源
2017 IEEE ENERGY CONVERSION CONGRESS AND EXPOSITION (ECCE) | 2017年
基金
英国工程与自然科学研究理事会;
关键词
Wide band gap semiconductors; Silicon carbide; MOSFET; Measurement; Gate Drive;
D O I
暂无
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
Wide Band Gap power semiconductor switching devices offer superior performance compared to an equivalent Si power device. SiC MOSFETs can be competitive when compared to Si IGBTs of the same voltage class, whilst offering greater benefits at high switching frequencies. Operating SiC MOSFETs at high switching frequencies imposes significant challenges, including: Ringing and voltage overshoot issues, making accurate high bandwidth measurements, and the requirement for a high-performance gate drive circuit. This paper presents a prototype low inductance PCB design for a SiC MOSFET switching circuit. In addition, a linear current gate-drive circuit and a high bandwidth on-board measurement system have been developed and the designs for these are presented. The measurement system showed good agreement with the external probe measurements and superior bandwidth. Hard-switching tests with a 900V SiC MOSFET showed that the dV(DS)/dt becomes largely invariant to changes in load current when using a current source gate drive. The measured dV(DS)/dt slew rates are compared with the dV(DS)/dt slew rates estimated from the parameter values given in the SiC MOSFET datasheet, and the two sets of results show good agreement. In this paper, the performance of an optimised circuit is successfully demonstrated and the benefits are discussed.
引用
收藏
页码:5093 / 5100
页数:8
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