First results of a TES microcalorimeter AC-biased at 500 kHz

被引:3
作者
Baars, NHR [1 ]
van der Kuur, J [1 ]
Lubbers, MP [1 ]
de Korte, PAJ [1 ]
机构
[1] SRON, Natl Inst Space Res, NL-3584 CA Utrecht, Netherlands
关键词
microcalorimeter; read-out;
D O I
10.1016/j.nima.2003.11.318
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
First performance results of a transition edge sensor (TES) microcalorimeter, AC-biased at 500 kHz, are presented in succession to earlier results at 46 kHz. Measurements on the bias circuit reveal a series resistance due to dielectric losses in the superconducting Nb/Ta-Oxide capacitor, which degrades the voltage bias. To improve frequency stability of the bias circuit against a large signal-amplitude range ways to reduce coupling between the SQUID feedback and input coil have been explored. I-V curves measured for different bath temperatures show hysteresis in the switch-on and switchoff behaviour of the TES for bias points low in the resistive transition. (C) 2003 Elsevier B.V. All rights reserved.
引用
收藏
页码:574 / 577
页数:4
相关论文
共 8 条
  • [1] The X-ray Evolving Universe Spectroscopy mission (XEUS) requirements of the X-ray focal plane instruments
    de Korte, PAJ
    Bavdaz, M
    Duband, L
    Holland, AD
    Peacock, TJ
    Strüder, L
    [J]. X-RAY OPTICS, INSTRUMENTS, AND MISSIONS II, 1999, 3766 : 103 - 126
  • [2] DC SQUID series array amplifiers with 120 MHz bandwidth
    Huber, ME
    Neil, PA
    Benson, RG
    Burns, DA
    Corey, AM
    Flynn, CS
    Kitaygorodskaya, Y
    Massihzadeh, O
    Martinis, JM
    Hilton, GC
    [J]. IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 2001, 11 (01) : 1251 - 1256
  • [3] Kiviranta M, 2002, AIP CONF PROC, V605, P295, DOI 10.1063/1.1457649
  • [4] Lee A. S, 2003, COMMUNICATION
  • [5] STHALE C, 1999, P SOC PHOTO-OPT INS, V3765, P82
  • [6] AC biased TES-based X-ray microcalorimeter with an energy resolution of 6.3 eV at 5.89 keV
    van der Kuur, J
    de Korte, PAJ
    Hoevers, HFC
    Tiest, WMB
    Baars, NHR
    Ridder, ML
    Krouwer, E
    Bruijn, MP
    Kiviranta, M
    Seppä, H
    [J]. IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 2003, 13 (02) : 638 - 642
  • [7] Performance of an x-ray microcalorimeter under ac biasing
    van der Kuur, J
    de Korte, PAJ
    Hoevers, HFC
    Kiviranta, M
    Seppä, H
    [J]. APPLIED PHYSICS LETTERS, 2002, 81 (23) : 4467 - 4469
  • [8] VANDENKUUR J, 2003, LTD 10 C P GEN IT 20