A novel wire scanner for high-intensity pulsed beams

被引:3
作者
Back, CH [1 ]
King, F [1 ]
Collet, G [1 ]
Kirby, R [1 ]
Field, C [1 ]
机构
[1] Stanford Univ, Stanford Linear Accelerator Ctr, Stanford, CA 94309 USA
关键词
beam profile; wire scanner; silicon; membrane;
D O I
10.1016/S0168-9002(99)00568-9
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A novel wire scanner has been developed with applications at linear accelerators where small beam spots or high intensities would otherwise destroy wires. A pattern of wires is supported on a thin membrane and remains in place even when punctured by the beam. Many scans can be made before the material needs to be replaced. Tests of the principle have been carried out at the Final Focus Test Beam at SLAG. (C) 1999 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:318 / 325
页数:8
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