Design and Characterization of Polarization-Reversed AlInGaN Based Ultraviolet Light-Emitting Diode

被引：14

作者：

Chang, Yi-An ^{[1
]}

Lin, Yu-Rui ^{[2
]}

Chang, Jih-Yuan ^{[1
]}

Wang, Tsun-Hsin ^{[1
]}

Kuo, Yen-Kuang ^{[1
]}

机构：

[1] Natl Changhua Univ Educ, Dept Phys, Changhua 500, Taiwan

[2] Natl Changhua Univ Educ, Inst Photon, Changhua 500, Taiwan

来源：

IEEE JOURNAL OF QUANTUM ELECTRONICS | 2013年 / 49卷 / 06期

关键词：

AlInGaN; ultraviolet light-emitting diodes; reversed polarization; numerical simulation; QUANTUM; MODEL; FABRICATION; SIMULATION;

D O I：

10.1109/JQE.2013.2259467

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The effect of using polarization-reversed AlInGaN-based quantum well active region in ultraviolet light-emitting diode is numerically investigated. By employing Al0.54In0.26Ga0.20N and Al0.83In0.17N as barrier and electron blocking layers, which ably reverse the direction of the polarization in Al0.005In0.02Ga0.975N quantum well and provide sufficient potential barrier height to confine electrons in the conduction band, simulation results show that the energy band profile of the Al0.005In0.02Ga0.975N quantum well is tilted up, resulting in better carrier confinement and more uniform distribution of carriers in the quantum well. Moreover, the overlap between electron and hole wave functions is increased and the Auger recombination is suppressed effectively, which in turn improves the radiative recombination efficiency.

引用

页码：553 / 559

页数：7

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