The method of total internal reflection ellipsometry for thin film characterisation and sensing

被引：79

作者：

Nabok, Alexei ^{[1
]}

Tsargorodskaya, Anna ^{[1
]}

机构：

[1] Sheffield Hallam Univ, Mat & Engn Res Inst, Sheffield S1 1WB, S Yorkshire, England

来源：

THIN SOLID FILMS | 2008年 / 516卷 / 24期

关键词：

Spectroscopic ellipsometry; Surface plasmon resonance; Total internal reflection ellipsometry; Electrostatic self-assembly; DNA hybridization; Immune sensing;

D O I：

10.1016/j.tsf.2007.11.077

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Recently developed method of Total Internal Reflection Ellipsometry (TIRE) represents a very successful combination of the spectroscopic ellipsometry instrumentation with the Kretchmann type Surface Plasmon Resonance (SPR) geometry of the experiment. The modelling shows much higher sensitivity of the TIRE method to small changes in optical parameters (thickness and refractive index) of thin films, as compared to both traditional external reflection ellipsometry and SPR. Considering another advantage of performing the measurements in media of different optical density (and even opaque media), TIRE becomes very convenient for different sensing applications in both gaseous and liquid media, as well as for thin film characterisation. This work presents examples of applications of the TIRE method for the study of DNA hybridization and the registration of low molecular weight toxins. (C) 2007 Elsevier B.V. All rights reserved.

引用

页码：8993 / 9001

页数：9

共 50 条

[31] Registration of low molecular weight environmental toxins with total internal reflection ellipsometry
Nabok, AV
Tsargorodskaya, A
Holloway, A
Starodub, NF
Demchenko, A
Gojster, O
PROCEEDINGS OF THE IEEE SENSORS 2004, VOLS 1-3, 2004, : 1195 - 1198
[32] OPTICAL PROPERTIES OF THIN FILMS ON TRANSPARENT SURFACES BY ELLIPSOMETRY - INTERNAL REFLECTION FOR FILM COVERED SURFACES NEAR CRITICAL ANGLE
PASSAGLIA, E
STROMBERG, RR
JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS SECTION A-PHYSICS AND CHEMISTRY, 1964, A 68 (06): : 601 - +
[33] Total internal reflection ellipsometry: ultrahigh sensitivity for protein adsorption on metal surfaces
Poksinski, Michal
Arwin, Hans
OPTICS LETTERS, 2007, 32 (10) : 1308 - 1310
[34] Total internal reflection ellipsometry based SPR sensor for studying biomolecular interaction
Pant, Udit
Mohapatra, Saswat
Moirangthem, Rakesh S.
MATERIALS TODAY-PROCEEDINGS, 2020, 28 : 254 - 257
[35] Robust Extraction of Hyperbolic Metamaterial Permittivity Using Total Internal Reflection Ellipsometry
Zhang, Cheng
Hong, Nina
Ji, Chengang
Zhu, Wenqi
Chen, Xi
Agrawal, Amit
Zhang, Zhong
Tiwald, Tom E.
Schoeche, Stefan
Hilfiker, James N.
Guo, L. Jay
Lezec, Henri J.
ACS PHOTONICS, 2018, 5 (06): : 2234 - 2242
[36] Total Internal Reflection Ellipsometry Approach for Bloch Surface Waves Biosensing Applications
Buzavaite-Verteliene, Ernesta
Maciulis, Vincentas
Anulyte, Justina
Tolenis, Tomas
Baskys, Algirdas
Plikusiene, Ieva
Balevicius, Zigmas
BIOSENSORS-BASEL, 2022, 12 (08):
[37] Detection of Influenza A by Surface Plasmon Resonance Enhanced Total Internal Reflection Ellipsometry
Keske, Arzu
Atar, Asli
Ustundag, Ilknur
Caglayan, Mustafa Oguzhan
JOURNAL OF COMPUTATIONAL AND THEORETICAL NANOSCIENCE, 2014, 11 (04) : 981 - 986
[38] In situ study of ligand-receptor interaction by total internal reflection ellipsometry
Balevicius, Z.
Baleviciute, I.
Tumenas, S.
Tamosaitis, L.
Stirke, A.
Makaraviciute, A.
Ramanaviciene, A.
Ramanavicius, A.
THIN SOLID FILMS, 2014, 571 : 744 - 748
[39] Smooth and rough Proteus mirabilis lipopolysaccharides studied by total internal reflection ellipsometry
Glenska-Olender, J.
Dworecki, K.
Sek, S.
Kwinkowski, M.
Kaca, W.
THIN SOLID FILMS, 2013, 548 : 343 - 348
[40] Optical bistability and modulation of light in a thin-film resonator based on total internal reflection
Soler, AD
Udoev, YP
TECHNICAL PHYSICS, 1997, 42 (12) : 1406 - 1410

← 1 2 3 4 5 →