Elucidating the hydration properties of paste containing thin film transistor liquid crystal display waste glass

被引:23
|
作者
Lin, Kae-Long [1 ]
Wang, Nian-Fu [2 ]
Shie, Je-Lueng [1 ]
Lee, Tzen-Chin [3 ]
Lee, Chau [2 ]
机构
[1] Natl Ilan Univ, Dept Environm Engn, Ilan 26041, Taiwan
[2] Natl Cent Univ, Dept Civil Engn, Chungli 320, Taiwan
[3] NUU Lienda, Dept Civil & Disaster Prevent Engn, Miaoli 36003, Taiwan
关键词
Thin film transistor liquid crystal display; Blended cement paste; Hydration; Pozzolanic reaction;
D O I
10.1016/j.jhazmat.2008.02.044
中图分类号
X [环境科学、安全科学];
学科分类号
08 ; 0830 ;
摘要
This study discusses the thin film transistor liquid crystal display (TFT-LCD) waste glass-blended cement (WGBC) pastes. It presents their compressive strength, their products of hydration and solid silicates changes. The samples were subjected to Fourier transformation infrared spectroscopy, differential thermal and thermo-gravimetric analysis and Si-29 magnetic angle spinning/nuclear magnetic resonance. The experimental XRD results demonstrated the speciation of the TFT-LCD waste glass, and that the major component was SiO2. At 40% substitution of TFT-LCD waste glass, at 28 days and 56 days, the compressive strength was 35% and 30% lower, respectively, than that of the Portland cement paste. The intensity of the Ca(OH)(2) band at 3710cm(-1) in the 56-day hydrated products of the WGBC pastes that contain TFT-LCD waste glass exhibit comparatively weak peaks suggesting that much Ca(OH)(2) during hydration was consumed. Later, the C-S-H contents of the WGBC pastes increased, revealing that liberated Ca(OH)(2) was consumed in pozzolanic reactions. (C) 2008 Elsevier B.V. All rights reserved.
引用
收藏
页码:471 / 475
页数:5
相关论文
共 50 条
  • [31] Ultraviolet nanoimprint lithography applicable to thin-film transistor liquid-crystal display
    Lee, Eung-sug
    Jeong, Jun-ho
    Kim, Ki-don
    Choi, Dae-geun
    Choi, Jun-hyuk
    Lee, Dong-Il
    Altun, Ali Ozhan
    Lee, Soon-won
    MICROPROCESSES AND NANOTECHNOLOGY 2007, DIGEST OF PAPERS, 2007, : 422 - 423
  • [32] Photoresist ashing in four-mask fabrication of thin film transistor liquid crystal display
    Beijing BOE Optoelectronics Technology CO.LTD, Beijing 100176, China
    不详
    Zhenkong Kexue yu Jishu Xuebao, 2008, 4 (291-294):
  • [33] Synthesis of aluminum-mesoporous MCM-41 humidity control material from thin-film transistor liquid crystal display waste glass and sandblasting waste and its application
    Lin, Ya-Wen
    Lee, Wei-Hao
    Chen, Chiao-Ying
    Liu, Yan-Jun
    Zhang, Wei-Qing
    Lin, Mei-Yu
    Lin, Kae-Long
    BOLETIN DE LA SOCIEDAD ESPANOLA DE CERAMICA Y VIDRIO, 2023, 62 (04): : 357 - 367
  • [34] An integrated algorithm for cutting stock problems in the thin-film transistor liquid crystal display industry
    Lu, Hao-Chun
    Huang, Yao-Huei
    Tseng, Kuo-An
    COMPUTERS & INDUSTRIAL ENGINEERING, 2013, 64 (04) : 1084 - 1092
  • [35] Biological treatment of thin-film transistor liquid crystal display (TFT-LCD) wastewater
    Lei, C. N.
    Whang, L. M.
    Lin, H. L.
    WATER SCIENCE AND TECHNOLOGY, 2008, 58 (05) : 1001 - 1006
  • [37] A study on the lot production management in a thin-film-transistor liquid-crystal display fab
    Ho, Ying-Chin
    Lin, Jian-Wei
    Liu, Hao-Cheng
    Yih, Yuehwern
    JOURNAL OF MANUFACTURING SYSTEMS, 2016, 40 : 9 - 25
  • [38] Assessment of Manual Operation Time for the Manufacturing of Thin Film Transistor Liquid Crystal Display: A Bayesian Approach
    Shen, Chien-wen
    IAENG TRANSACTIONS ON ENGINEERING TECHNOLOGIES VOL 1, 2009, 1089 : 168 - 177
  • [39] The effect of heating temperature of thin film transistor-liquid crystal display (TFT-LCD) optical waste glass as a partial substitute partial for clay in eco-brick
    Lin, Kae-Long
    JOURNAL OF CLEANER PRODUCTION, 2007, 15 (18) : 1755 - 1759
  • [40] Feasibility of an Ag-alloy film as a thin-film transistor liquid-crystal display source/drain material
    C. O. Jeong
    N. S. Roh
    S. G. Kim
    H. S. Park
    C. W. Kim
    D. S. Sakong
    J. H. Seok
    K. H. Chung
    W. H. Lee
    Dongwen Gan
    Paul S. Ho
    B. S. Cho
    B. J. Kang
    H. J. Yang
    Y. K. Ko
    J. G. Lee
    Journal of Electronic Materials, 2002, 31 : 610 - 614