Background Noise Suppression of Optical Sectioning Structured Illumination Microscopy via Fourier Domain Reconstruction

被引：2

作者：

Dang, Shipei

Qian, Jia

Peng, Tong

Bai, Chen

Min, Junwei

Wang, Haixia

Yao, Baoli

Dan, Dan

机构：

[1] State Key Laboratory of Transient Optics and Photonics, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an

[2] University of Chinese Academy of Sciences, Beijing

[3] The Third Affiliated Hospital of Sun Yat-sen University, Guangzhou

来源：

FRONTIERS IN PHYSICS | 2022年 / 10卷

关键词：

structured illumination microscopy (SIM); optical sectioning; background noise suppression; image reconstruction; Fourier domain;

D O I：

10.3389/fphy.2022.900686

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Optical sectioning structured illumination microscopy (OS-SIM) has been attracting considerable interest in fast 3D microscopy. The reconstruction of optical sectioning images in the conventional method employs the root-mean-square (RMS) algorithm in the spatial domain, which is prone to residual background noise. To overcome this problem, we propose a Fourier domain based optical sectioning image reconstruction algorithm (termed Fourier-OS-SIM), which has an improved background noise suppression capability compared to the RMS algorithm. The experimental results verified the feasibility and the effectiveness of the algorithm. The improved performance of the Fourier-OS-SIM may find more applications in biomedical or industrial fields.

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