In situ x-ray photoelectron spectroscopy for electrochemical reactions in ordinary solvents

被引：80

作者：

Masuda, Takuya ^{[1
,2
]}

Yoshikawa, Hideki ^{[3
]}

Noguchi, Hidenori ^{[1
,2
,4
,5
]}

Kawasaki, Tadahiro ^{[6
]}

Kobata, Masaaki ^{[3
]}

Kobayashi, Keisuke ^{[3
]}

Uosaki, Kohei ^{[1
,4
,5
]}

机构：

[1] Natl Inst Mat Sci NIMS, Global Res Ctr Environm & Energy Based Nanomat Sc, Tsukuba, Ibaraki 3050044, Japan

[2] Japan Sci & Technol Agcy JST, PRESTO, Kawaguchi, Saitama 3330012, Japan

[3] Natl Inst Mat Sci NIMS, Synchrotron Xray Stn SPring 8, Sayo, Hyogo 6795148, Japan

[4] Hokkaido Univ, Grad Sch Chem Sci & Engn, Sapporo, Hokkaido 0600810, Japan

[5] Natl Inst Mat Sci NIMS, Int Ctr Mat Nanoarchitecton WPI MANA, Tsukuba, Ibaraki 3050044, Japan

[6] Nagoya Univ, Grad Sch Engn, Chikusa Ku, Nagoya, Aichi 4648603, Japan

来源：

APPLIED PHYSICS LETTERS | 2013年 / 103卷 / 11期

关键词：

IONIC LIQUID; WATER; INTERFACE; OXIDATION; VALENCE; STATE; XPS;

D O I：

10.1063/1.4821180

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

In situ electrochemical X-ray photoelectron spectroscopy (XPS) apparatus, which allows XPS at solid/liquid interfaces under potential control, was constructed utilizing a microcell with an ultra-thin Si membrane, which separates vacuum and a solution. Hard X-rays from a synchrotron source penetrate into the Si membrane surface exposed to the solution. Electrons emitted at the Si/solution interface can pass through the membrane and be analyzed by an analyzer placed in vacuum. Its operation was demonstrated for potential-induced Si oxide growth in water. Effect of potential and time on the thickness of Si and Si oxide layers was quantitatively determined at sub-nanometer resolution. (C) 2013 AIP Publishing LLC.

引用

页数：4

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