Detection of Near-Duplicate Patches in Random Images Using Keypoint-Based Features

被引:0
作者
Sluzek, Andrzej [1 ]
Paradowski, Mariusz [2 ]
机构
[1] Khalifa Univ, Abu Dhabi, U Arab Emirates
[2] Wroclaw Univ Technol, PL-50370 Wroclaw, Poland
来源
ADVANCED CONCEPTS FOR INTELLIGENT VISION SYSTEMS (ACIVS 2012) | 2012年 / 7517卷
关键词
configurations of keypoints; keypoint correspondences; near-duplicate areas; local features; feature descriptors; affine invariance; object detection;
D O I
暂无
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
Detection of similar fragments in unknown images is typically based on the hypothesize-and-verify paradigm. After the keypoint correspondences are found, the configuration constraints are used to identify clusters of similar and similarly transformed keypoints. This method is computationally expensive and hardly applicable to large databases. As an alternative, we propose novel affine-invariant TERM features characterizing geometry of groups of elliptical keyregions so that similar patches can be found by feature matching only. The paper overviews TERM features and reports experimental results confirming their high performances in image matching. A method combining visual words based on TERM descriptors with SIFT words is particularly recommended. Because of its low complexity, the proposed method can be prospectively used with visual databases of large sizes.
引用
收藏
页码:301 / 312
页数:12
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