Terahertz continuous wave system using phase shift interferometry for measuring the thickness of sub-100-μm-thick samples without frequency sweep

被引：8

作者：

Choi, Da-Hye ^{[1
]}

Lee, Il-Min ^{[1
]}

Moon, Kiwon ^{[1
]}

Park, Dong Woo ^{[1
]}

Lee, Eui Su ^{[1
]}

Park, Kyung Hyun ^{[1
]}

机构：

[1] ETRI, Terahertz Basic Res Sect, Daejeon 34129, South Korea

来源：

OPTICS EXPRESS | 2019年 / 27卷 / 10期

关键词：

RESOLUTION; LASER;

D O I：

10.1364/OE.27.014695

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A terahertz continuous wave system is demonstrated for thickness measurement using Gouy phase shift interferometry without frequency sweep. One anti of the interferometer utilizes a collimated wave as a reference, and the other arm applies a focused beam for sample investigation. When the optical path difference (OPD) of the anus is zero, a destructive interference pattern is produced. Interference signal intensity changes induced by the OPD changes can be easily predicted by calculations. By minimizing the difference between the measured and the calculated signal against the OPD, the thicknesses of sub-100-mu m-thick samples are determined at 625 GHz. (C) 2019 Optical Society of America under the terms of the OSA Open Access Publishing Agreement

引用

页码：14695 / 14704

页数：10

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