FATIGUE BEHAVIOUR OF LEAD-FREE SOLDER INTERCONNECTIONS IN LIFE PREDICTION OF TRILAYER STRUCTURES SUBJECTED TO THERMAL CYCLING

被引:0
|
作者
Shirazi, Alireza [1 ]
Lu, Hua [2 ]
Varvani-Farahani, Ahmad [2 ]
机构
[1] Hitachi Truck Mfg, Guelph, ON, Canada
[2] Ryerson Univ, Toronto, ON, Canada
关键词
SnAgCu LEAD-FREE SOLDER; THERMAL FATIGUE; TRILAYER STRUCTURE;
D O I
暂无
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Trilayer structures such as flip chip plastic ball grid array (FC-PBGA) packages are bodies made of a large variety of dissimilar materials. Due to the coefficients of thermal expansion (CTE) mismatches between and temperature gradients within the layers, thermally induced interaction becomes a typical type of the loads for the joint layer made of lead-free solder joint interconnections. Thermal stresses and strains at the interfaces of solder joints and neighboring adhesive layers are the cause for solder joint fatigue failures, which account for the most common package failures. The current study puts forward a fatigue life prediction method for a trilayer structure using the critical plane-energy fatigue damage parameter in combination with the modified Coffin-Manson life model. The proposed method of calculated fatigue damage parameter for the samples of study, along with their experimental life (N-f50%) under two different thermal conditions is presented. The values of life in (0-100 degrees C) condition and (25-25 degrees C) with the same temperature ramp rate and dwell conditions are found to differ by a factor of 1.3 where the structures tested under (0-100 degrees C) condition show lower lives. The present study further correlated the fatigue damage parameters with the Coffm-Manson type equation to calculate/predict the fatigue life of structures under (25-125 degrees C) condition. The results of the N-f50 fatigue life prediction versus the experimental cycles show that the predicted lives of samples with SAC305 solder joints fall apart with a factor ranging from (1.24)similar to(-1.45). The advantage of the proposed method in comparison with the existing method in life prediction of the trilayer structure with solder alloy is that there are no empirical parameters involved in energy-critical plane damage parameter in life prediction of the trilayer structure. Parameters within the proposed approach purely involves mechanical and fatigue properties of the midlayer alloy.
引用
收藏
页数:13
相关论文
共 50 条
  • [41] Thermal-fatigue life prediction equation for wafer-level chip scale package (WLCSP) lead-free solder joints on lead-free printed circuit board (PCB)
    Lau, JH
    Shangguan, D
    Lau, DCY
    Kung, TTW
    Lee, SWR
    54TH ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE, VOLS 1 AND 2, PROCEEDINGS, 2004, : 1563 - 1569
  • [42] Microstructural changes of lead-free solder joints during long-term ageing, thermal cycling and vibration fatigue
    Fix, Andreas R.
    Nuechter, Wolfgang
    Wilde, Juergen
    SOLDERING & SURFACE MOUNT TECHNOLOGY, 2008, 20 (01) : 13 - 21
  • [43] A comparative study on thermal and mechanical fatigue Behavior for lead-free solder joints
    Kim, Ilho
    Lee, Soon-Bok
    2006 INTERNATIONAL CONFERENCE ON ELECTRONIC MATERIALS AND PACKAGING, VOLS 1-3, 2006, : 491 - 511
  • [44] Considerations in Solution Stabilization for Thermal Fatigue Modeling of Lead-free Solder Joints
    Chan, Y. Sing
    Lee, S. W. Ricky
    2011 IEEE 61ST ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC), 2011, : 1070 - 1078
  • [45] Effect of void formation on thermal fatigue reliability of lead-free solder joints
    Kim, DS
    Yu, Q
    Shibutani, T
    Sadakata, N
    Inoue, T
    ITHERM 2004, VOL 2, 2004, : 325 - 329
  • [46] Effects of element partition on the fatigue life predictions of lead-free solder joints
    Jong, Wen-Ren
    Tsai, Hsin-Chun
    Huang, Ching-Tzu
    ICEPT: 2007 8TH INTERNATIONAL CONFERENCE ON ELECTRONICS PACKAGING TECHNOLOGY, PROCEEDINGS, 2007, : 617 - +
  • [47] A study on evaluation technique for the fatigue life scatter of lead-free solder joints
    Miyauchi, Hiroki
    Yu, Qiang
    Shibutani, Tadahiro
    Shiratori, Masaki
    PROCEEDINGS OF THE ASME INTERNATIONAL MECHANICAL ENGINEERING CONGRESS AND EXPOSITION 2007, VOL 5: ELECTRONICS AND PHOTONICS, 2008, : 325 - 332
  • [48] A General Methodology to Predict Fatigue Life in Lead-Free Solder Alloy Interconnects
    Pierce, David M.
    Sheppard, Sheri D.
    Vianco, Paul T.
    JOURNAL OF ELECTRONIC PACKAGING, 2009, 131 (01) : 0110081 - 01100811
  • [49] A new creep-fatigue life model of lead-free solder joint
    Zhu, Yongxin
    Li, Xiaoyan
    Wang, Chao
    Gao, Ruiting
    MICROELECTRONICS RELIABILITY, 2015, 55 (07) : 1097 - 1100
  • [50] Measurement of acceleration factor for lead-free solder (SnAg3.8Cu0.7) in thermal cycling test of BGA components and calibration of lead-free solder joint model for life prediction by finite element analyses.
    Andersson, K
    Salmela, O
    Perttula, A
    Särkkä, J
    Tammenmaa, M
    Thermal, Mechanical and Multi-Physics Simulation and Experiments in Micro-Electronics and Micro-Systems, 2005, : 448 - 453