X-ray backscatter tomography: NDT potential and limitations

被引：11

作者：

Poranski, CF ^{[1
]}

Greenawald, EC ^{[1
]}

Ham, YS ^{[1
]}

机构：

[1] GEOCENTERS INC, FT WASHINGTON, MD 20744 USA

来源：

NONDESTRUCTIVE CHARACTERIZATION OF MATERIALS VII, PTS 1 AND 2 | 1996年 / 210-2卷

关键词：

x-ray; x-ray backscatter; tomography; Compton scattering;

D O I：

10.4028/www.scientific.net/MSF.210-213.211

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Although techniques for materials characterization with backscatter radiation have been known for a long time, only recently have such methods offered promise of practical NDT capability. This is the result of advances in detector technology coupled with the development of low cost computer processing power. One system making use of these developments is the ComScan, an x ray backscatter tomography system developed by Philips, At NRL we have had considerable success with the ComScan in developing a one-sided NDT procedure for Navy Sonar Domes. We have had the opportunity to apply the instrument to several other NDT problems with mixed success. We find that the ComScan is often applicable, but it is not always the best approach for a particular NDT problem.

引用

页码：211 / 218

页数：8