Process-structure-properties relationship in direct liquid injection chemical vapor deposition of amorphous alumina from aluminum tri-isopropoxide

被引:10
作者
Etchepare, Pierre-Luc [1 ]
Baggetto, Loic [1 ]
Vergnes, Hugues [2 ]
Samelor, Diane [1 ]
Sadowski, Daniel [1 ]
Caussat, Brigitte [2 ]
Vahlas, Constantin [1 ]
机构
[1] Univ Toulouse, Ctr Interuniv Rech & Ingn Mat, ENSIACET, INPT, Toulouse, France
[2] Univ Toulouse, Lab Genie Chim, ENSIACET, INPT, Toulouse, France
来源
PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 12, NO 7 | 2015年 / 12卷 / 07期
关键词
aluminum isopropoxide; amorphous alumina films; direct liquid injection; hydrothermal ageing; glass surface; ISO-PROPOXIDE; THIN-FILMS; OXIDE; COATINGS; CVD; PRESSURE; ADHESION; GROWTH; MOCVD; ESCA;
D O I
10.1002/pssc.201510037
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
We propose a method to apply amorphous alumina films on the inner surface of glass containers aiming to improve their hydrothermal barrier property. We have carried out alumina deposition on Si substrates as a function of deposition temperature to determine the physicochemical properties of the thin film materials, and on glass containers to evaluate the influence of postdeposition hydrothermal ageing on the films properties. Film preparation has been achieved by metal-organic chemical vapor deposition (MOCVD), using triisopropoxide aluminum (ATI) dissolved in anhydrous cyclohexane as precursor, in a temperature range between 360 degrees C and 600 degrees C. A direct liquid injection technology is used to feed the reactor in a controlled and reproducible way. The amorphous alumina films have been characterized by several techniques such as XRD, EPMA, XPS, SEM, AFM and scratch-test method. Films are amorphous and hydroxylated at 360 and 420 degrees C and close to stoichiometric at 490 and 560 degrees C. Hydrothermal ageing simulated by a standard sterilization cycle modifies the adhesion and surface morphology of the alumina film on glass containers to a rough, porous and nonadhesive layer. Elemental compositions of alumina films on Si substrates. O/Al atomic ratios (EPMA) for films processed in the horizontal (blue dots) and vertical (red dots) reactors. Carbon concentration for films deposited in the horizontal (black dots) and vertical (white dots) reactors, determined, respectively, by XPS and EPMA. Films processed at high temperatures (490-560 degrees C) are stoichiometric Al2O3 with a very low amount of hydroxyl groups. Carbon concentrations are lower than 1 at%. (C) 2015 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
引用
收藏
页码:944 / 952
页数:9
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