共 50 条
- [41] High reliability amorphous oxide semiconductor thin-film transistors gated by buried thick aluminum PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, 2012, 6 (9-10): : 403 - 405
- [48] HIGH-FIELD EFFECTS IN POLYSILICON THIN-FILM TRANSISTORS IEE PROCEEDINGS-CIRCUITS DEVICES AND SYSTEMS, 1994, 141 (01): : 45 - 49