Electron-impact detachment and dissociation of C4- ions

被引:13
|
作者
Le Padellec, A
Rabilloud, F
Pegg, D
Neau, A
Hellberg, F
Thomas, R
Schmidt, HT
Larsson, M
Danared, H
Källberg, A
Andersson, K
Hanstorp, D
机构
[1] Univ Toulouse 3, LCAR UMR 5589, F-31062 Toulouse 4, France
[2] Univ Tennessee, Dept Phys, Knoxville, TN 37996 USA
[3] Univ Stockholm, Dept Phys, S-11385 Stockholm, Sweden
[4] Manne Siegbahn Lab, SE-10405 Stockholm, Sweden
[5] Chalmers Univ Technol, Univ Gothenburg, Dept Phys, SE-41296 Gothenburg, Sweden
来源
JOURNAL OF CHEMICAL PHYSICS | 2001年 / 115卷 / 23期
关键词
D O I
10.1063/1.1421068
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
CRYRING was used to study collision processes between an electron and a negative ion cluster C-4(-). The total detachment cross sections for the production of the neutral 4C, 3C, 2C, and C fragments were measured. The cross sections for pure detachment, and for detachment plus dissociation leading to the production of C-3+C, 2C(2), and C-2+2C were extracted using a grid. It was found that the pure detachment process overwhelmingly dominates all other fragmentation processes. The threshold location for the detachment channel is found to be around 6.0 eV. Although the doubly charged negative ion C-4(2-) has received little previous attention, a defined near-threshold resonance observed in the detachment cross section curve, has been associated with the short-lived state C-4(2-) (0.7 fs lifetime). (C) 2001 American Institute of Physics.
引用
收藏
页码:10671 / 10677
页数:7
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