Adsorption of benzene on Si(001) from noncontact atomic force microscopy simulation

被引：1

作者：

Masago, Akira ^{[1
]}

Watanabe, Satoshi ^{[1
]}

Tagami, Katsunori ^{[2
]}

Tsukada, Masaru ^{[2
]}

机构：

[1] Univ Tokyo, Dept Mat Engn, Bunkyo Ku, Tokyo 1138656, Japan

[2] Waseda Univ, Dept Nanosci & Nanoengn, Shinjuku Ku, Tokyo 1620041, Japan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS | 2008年 / 47卷 / 07期

关键词：

topographic line profile; Si(001)-c(4x2); van der Waals force;

D O I：

10.1143/JJAP.47.6092

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We have simulated noncontact atomic force microscopy on benzene-molecule-adsorbed Si(001) surfaces using the density-functional based tight-binding Calculation. We show that three adsorption structures. namely, the standard butterfly, the tight bridge. and the twisted bridge, can be distinguished from topographic line profiles along directions perpendicular and parallel to the Si dimer row. The atomic configuration does not change markedly during the noncontact atomic force microscopy line scan even when the tip almost contacts the Surface, which Suggests that a stable adsorbed structure hardly changes to another stable structure at zero temperature.

引用

页码：6092 / 6095

页数：4

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