Direct sample insertion for inductively coupled plasma spectrometry

被引：25

作者：

Sing, R ^{[1
]}

机构：

[1] Univ Montreal, Dept Chim, Montreal, PQ H3C 3J7, Canada

来源：

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY | 1999年 / 54卷 / 3-4期

关键词：

inductively coupled plasma; sample introduction; direct sample insertion;

D O I：

10.1016/S0584-8547(99)00020-8

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

Direct sample insertion (DSI) is an alternative sample introduction technique for inductively coupled plasma spectrometry whereby the sample, either liquid or solid, is placed onto or into a sample carrying probe which is inserted directly into the plasma. This review provides an overview of the DSI technique including instrumentation, operating parameters, system response, analytical figures of merit and applications. (C) 1999 Elsevier Science B.V. All rights reserved.

引用

页码：411 / 441

页数：31

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