inductively coupled plasma;
sample introduction;
direct sample insertion;
D O I:
10.1016/S0584-8547(99)00020-8
中图分类号:
O433 [光谱学];
学科分类号:
0703 ;
070302 ;
摘要:
Direct sample insertion (DSI) is an alternative sample introduction technique for inductively coupled plasma spectrometry whereby the sample, either liquid or solid, is placed onto or into a sample carrying probe which is inserted directly into the plasma. This review provides an overview of the DSI technique including instrumentation, operating parameters, system response, analytical figures of merit and applications. (C) 1999 Elsevier Science B.V. All rights reserved.
机构:
Univ Waterloo, Dept Chem, Guelph Waterloo Ctr Grad Work Chem, Waterloo, ON N2L 3G1, CanadaUniv Waterloo, Dept Chem, Guelph Waterloo Ctr Grad Work Chem, Waterloo, ON N2L 3G1, Canada
Karanassios, V
Wood, TJ
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机构:
Univ Waterloo, Dept Chem, Guelph Waterloo Ctr Grad Work Chem, Waterloo, ON N2L 3G1, CanadaUniv Waterloo, Dept Chem, Guelph Waterloo Ctr Grad Work Chem, Waterloo, ON N2L 3G1, Canada
机构:
Univ of Alberta, Edmonton, Alberta,, Can, Univ of Alberta, Edmonton, Alberta, CanUniv of Alberta, Edmonton, Alberta,, Can, Univ of Alberta, Edmonton, Alberta, Can
Youbin Shao
Horlick, Gary
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h-index: 0
机构:
Univ of Alberta, Edmonton, Alberta,, Can, Univ of Alberta, Edmonton, Alberta, CanUniv of Alberta, Edmonton, Alberta,, Can, Univ of Alberta, Edmonton, Alberta, Can