Practices in testing of mixed-signal and RF SoCs

被引：0
|
作者：
Abdennadher, S [1 ]
Shaikh, SA [1 ]
机构：
[1] Intel Corp, Folsom, CA 95630 USA
来源：
14TH ASIAN TEST SYMPOSIUM, PROCEEDINGS | 2005年
关键词：
D O I：
10.1109/ATS.2005.90
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：467 / 467
页数：1
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