The Use of Synchrotron Radiation for the Characterization of Artists' Pigments and Paintings

被引:58
|
作者
Janssens, Koen [1 ]
Alfeld, Matthias [1 ]
Van der Snickt, Geert [1 ]
De Nolf, Wout [1 ]
Vanmeert, Frederik [1 ]
Radepont, Marie [1 ]
Monico, Letizia [1 ,5 ,6 ]
Dik, Joris [2 ]
Cotte, Marine [3 ]
Falkenberg, Gerald [4 ]
Miliani, Costanza [5 ,6 ]
Brunetti, Brunetto G. [5 ,6 ]
机构
[1] Univ Antwerp, Dept Chem, B-2020 Antwerp, Belgium
[2] Delft Univ Technol, Dept Mat Sci, NL-2628 CD Delft, Netherlands
[3] European Synchrotron Radiat Facil, Expt Div, F-38043 Grenoble, France
[4] DESY, PETRA III Synchrotron, D-22607 Hamburg, Germany
[5] Univ Perugia, Ctr SMAArt, I-06123 Perugia, Italy
[6] Univ Perugia, CNR ISTM, Dept Chem, I-06123 Perugia, Italy
关键词
X-ray fluorescence; X-ray absorption structure; X-ray diffraction; microprobe; macroscopic imaging; pigment alteration; X-RAY-FLUORESCENCE; MONTE-CARLO-SIMULATION; ABSORPTION NEAR-EDGE; FRESNEL ZONE PLATES; DEGRADATION PROCESS; LEAD CHROMATE; PORTABLE XRF; MICRO-XRF; MU-XRF; CULTURAL-HERITAGE;
D O I
10.1146/annurev-anchem-062012-092702
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
We review methods and recent studies in which macroscopic to (sub) microscopic X-ray beams were used for nondestructive analysis and characterization of pigments, paint microsamples, and/or entire paintings. We discuss the use of portable laboratory-and synchrotron-based instrumentation and describe several variants of X-ray fluorescence (XRF) analysis used for elemental analysis and imaging and combined with X-ray diffraction (XRD) and X-ray absorption spectroscopy (XAS). Macroscopic and microscopic (mu-)XRF variants of this method are suitable for visualizing the elemental distribution of key elements in paint multilayers. Technical innovations such as multielement, large-area XRF detectors have enabled such developments. The use of methods limited to elemental analysis or imaging usually is not sufficient to elucidate the chemical transformations that take place during natural pigment alteration processes. However, synchrotron-based combinations of mu-XRF, mu-XAS, and mu-XRD are suitable for such studies.
引用
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页码:399 / 425
页数:27
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